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蒙特卡罗方法在X射线荧光分析中的一些应用
Application of Monte Carlo method for X-ray fluorescence analysis
【摘要】 本文给出了荧光过程的蒙特卡罗模拟,着重考虑了几种散射过程对特征X射线强度的影响。对几 种纯元素,计算了单位辐射下特征X射线的强度,与实验值取得了较好的一致。
【Abstract】 Monte Carlo method has deen applied to simulate the energy dispersive X-ray fluorescence course. The influences of the scattering processes of incident line in sample upon the intensity of the characteristic X-ray have particularly been considered in the simulation model separately. The intensities of the characteristic line for some pure elements under the unit incident radiation were calculated, and good agreement was obtained between the calculated and experimental results.
【关键词】 蒙特卡罗方法;
X射线荧光分析;
散射校正;
【Key words】 Monte Carlo method X-ray fluorescence analysis scattering correction;
【Key words】 Monte Carlo method X-ray fluorescence analysis scattering correction;
- 【文献出处】 核技术 ,Nuclear Techniques , 编辑部邮箱 ,1985年03期
- 【被引频次】6
- 【下载频次】116