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硅胶表面“接枝”度光电子能谱(XPS)的测定

Determination of the Graft Degree on the Surface of Silica GEL by XPS

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【作者】 黄惠忠; 郭沁林; 桂琳琳; 汪勤慰; 段晓青;

【Author】 Huang Huizhong, Guo Qinlin and Gui Linlin (The Institute of Physical, Chemistry, Peking University, Beijing)Wang Qinwei and Duan Xiaoqing (Department of Chemistry, Peking University, Beijing)

【机构】 北京大学物理化学研究所; 北京大学化学系; 北京大学化学系;

【摘要】 本文叙述了用XPS测定硅胶表面“接枝”度的半定量分析方法。

【Abstract】 Attention is being increasingly paid to the new material prepared by bonding organic molecules to the surface of silica gel in the preparation of catalyst or packing material for liquid chromatographic column.There has not been a quantitative method for determining or characterizing the graft degree on the silica gel surface yet. This paper provides a new semi-quantitative method.

  • 【文献出处】 高等学校化学学报 ,Chemical Research In Chinese Universities , 编辑部邮箱 ,1985年08期
  • 【被引频次】5
  • 【下载频次】79
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