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高温退火对GDa-SixC1-x:H 薄膜晶化特性的影响
Effect of High Temperature Annealing on Crystallized Characteristics of GD a-SixC1-x:H Films
【摘要】 对GDa-SixC1-x:H膜进行高温退火,当退火温度在550℃附近时晶化开始,随退火温度升高晶粒尺寸和晶化范围增大.晶化后的a-SixC1-x:H膜光吸收系数、光学带隙和电导激活能下降,室温电导率增加.
【Abstract】 The experimental results show that when the annealing temperature is~55℃,the crystallization of a-SixC1-x:H is initiated and the size of grain and the crystallizedregion increase with the raise of annealing temperature.The absorption coefficient,band gap and activation energy of these crystallized a-SixC1-x:H films decrease whilethe dark conductivity increases.
【基金】 中国科学院科学基金
- 【文献出处】 半导体学报 ,Chinese Journal of Semiconductors , 编辑部邮箱 ,1985年03期
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