节点文献
分析光学薄膜的椭偏方程的计算方法
Computation method for analysing ellipsometric equation of optical thin films
【摘要】 叙述了用测量到的椭偏角ψ及Δ来确定光学薄膜的折射率、厚度和消光系数的方法.该方法收敛较快并节省时间.
【Abstract】 A method for determining the refractive index, thickness and extinction coefficient of optical films from measured ellipsometric ψ and Δ is described. This method is founded more convergent and time-saving parameters.
- 【文献出处】 光学学报 ,Acta Optica Sinica , 编辑部邮箱 ,1984年10期
- 【被引频次】2
- 【下载频次】90