节点文献
用透射电镜研究PS薄膜银纹的微观结构、变形特性和破坏过程
STUDY ON THE MICROSTRUCTURE, DEFORMATION CHARACTERISTICS AND FAILURE PROCESS OF PS FILM CRAZES BY TEM
【摘要】 本文介绍了用透射电镜观察PS薄膜银纹的微观结构、变形特性和破坏过程。实验观察到PS银纹质完整的网络结构和取向银纹质断裂以后的松弛特性。实验发现PS银纹质断裂转变成微裂纹的过程类似有机玻璃慢裂纹区的“撕布”模式,裂端银纹的外形符合Dugdale模型。
【Abstract】 The structure and deformation characteristics of PS film craze in pregnant, growth, mature and failure process were studied by transmission electron microscopy (TEM). It is presumed that the fine white lines extended from craze tip along craze propagation direction are resulted from the tearing of PS molecular chain under tensile stress field. According to Our experimental results, the authours proposed the cold-drawn mechanism and transverse constraction of craze matter during plastic deformation. It was observed that the primary craze matter broke in accordance with the "tearing cloth" model and the crack-tip crazes have shape described by the Dugdale model. It was discoverd by TEM that the craze thickness increased in two ways, by the elongation of primary craze matter and by the converting of PS moleculers on craze/matrix polymer interface into craze, proposed by E. J. Kramer.
- 【文献出处】 高分子通讯 , 编辑部邮箱 ,1984年05期
- 【被引频次】2
- 【下载频次】114