【摘要】 用XPS测量了Pt/Si和Pd/Si 肖特基接触界面处的芯态谱和价带谱.界面处有硅化物M₂Si存在,对界面处金属芯态谱随光电子发射角变化的反常现象作了初步探讨.更多还原

【Abstract】 The spectra of the core level and valence band at Pt/Si and Pd/Si Schottky contactshave been measured by XPS.The result shows the existence of silicide of M₂ Si at the in-terface.Anomalous phenomenon of the metal core spectra change with photoelectron emis-sion angle has been discussed briefly.更多还原