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氧化铅靶层形貌、取向和晶粒度的观测
Observation and Measurement on the Microscopic Appearance, Preferred Orientation, Platelet Thickness of PbO Layers
【摘要】 光电导膜层的结晶系统、晶粒生长取向及晶粒度,是决定其光电导性能的基本因素.本文介绍了用扫描电镜、x射线衍射方法对氧化铅靶层的形貌取向晶粒度进行综合研究的结果,并对测量结果做了分析和讨论.
【Abstract】 This paper deals with the obtained comprehensive results of microscopic appearance,preferred orientation,platelet thickness of PbO layers by means of scanning electron micro-graphs and X-ray diffraction techniques.Some of the measured results are discussed.
- 【文献出处】 半导体学报 ,Chinese Journal of Semiconductors , 编辑部邮箱 ,1984年02期
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