【摘要】 <正> 2,3-二氨基萘(DAN)中痕量杂质引起的背景荧光是限制用该试剂测定超微量硒时灵敏度进一步提高的主要因素,因此,寻求合适的方法扣除每一个具体测试样品的杂质背景荧光以校正测试的荧光强度是提高这一方法灵敏度和精密度的重要途径。 1.原理和方法:DAN-Se络合物的荧光光谱和DAN的杂质荧光光谱是重叠的,但二者的吸收光谱是不同的,前者的最高荧光激发峰为378nm,用400nm波长的光激发获得的荧光更多还原

【Abstract】 Based on the difference of absorption spectra between 2,3-diaminonaphthalene-Se complex and the impurity in it, a method is suggested to calibrate the fluorescence intensity of the complex by deducting the fluorescent interference of the impurity. A calibration formula is given. F’_522/378=(F_522/378-b·F_522/400)/1-ab where F’_522/378 refers to the fluorescence intensity of the complex after calibration, a and b refer to the calibration coefficients. The detection limit can be attained from 1.2×10^-9 to 3.4×10^-11 in this way.更多还原