【摘要】 <正> 六氟化硫（SF₆）气体做为一种优良的绝缘和灭弧介质在高压电器、高能物理、冶金等领域中的应用日益广泛。在SF₆的生产和使用过程中常带入一定杂质;此外在某些外因（例如大功率电弧冲击、高温,高能粒子等）作用下其本身会发生分解并可与其它物质反应而产生若干分解产物,其中有些物质严重危害人身健康及设备安全。为此必须对SF₆气体中的痕量杂质实行严格的质量监测。关于SF₆气体中痕量杂质的测定已有很多论述,国际电工委员会（IEC）还专门制定了SF₆气体标准分析方法,但均未提出分别定性定量测定其中危害最大的含硫氟化物更多还原

【Abstract】 A gas chromatographic method for the determination of trace impurities in SF₆,such as SOF₂ and SO₂F₂,is described.A 2m×3mm stainless steel column of 3％di-isooctyl sebacate on silica gel was used.The components were detected simultaneously by FPD and TCD in series,and GC-MS as well as IR were used for their identification.In order to avoid the contamination of FPD with large amount of SF₆ and the interference of its large peak with the peaks of the impurities,a by-pass was utilized between the two detectors. Empirical calibration curves were used for accurate calculation of the contents by plotting their responses relative to that of SP₆ on a log-log scale. The accuracy and precision were good and the detection limits for SOF₂ and SO₂F₂ were 0.5 ppm and 5 ppm respectively.更多还原