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用背散射方法研究砷离子注入单晶硅的分布和热退火后的再分布
THE MEASUREMENTS OF ARSENIC DISTRIBUTION AND ITS REDISTRIBUTION AFTER THERMAL ANNEALING BY RBS
【摘要】 <正> 与注磷相比,五价的砷元素作为施主杂质注入半导体材料硅中,具有许多独特的优点:(1)固溶度高;(2)投影射程小,可以得到较浅的p-n结;(3)有可能通过人为控制,使砷扩散后的浓度分布趋于对发射极有利的矩形分布;(4)引起的损伤较浅,只要适
【Abstract】 In the present paper, the RBS results of 43 silicon single crystal samples implanted with arsenic have been described. Not only the arsenic doses in specimens have been checked, but also the arsenic profiles have been systematically measured for different implantation parameters and thermal annealing conditions. Consequently, the relations between arsenic redistributions after annealing and these parameters and conditions have been obtained.
- 【文献出处】 北京师范大学学报(自然科学版) ,Journal of Beijing Normal University(Natural Science) , 编辑部邮箱 ,1983年02期
- 【被引频次】1
- 【下载频次】31