【摘要】 同光路干涉方式虽可降低对光学系统调整的精度要求,但当用它测量不同反射率的光学零件时必须更换带不同反射率标准面的各部件,操作麻烦、附件繁多。本文提出了用两块1/4波片调整同光路参考光束与被测光束光强的方法。将两波片同时转动一个相同的角度,即可得高反差的干涉条纹。此法不仅对高反射率的零件而且对低反射率的零件都适用。更多还原

【Abstract】 The demands of making the optical system of a common-path interferometer can be lower than Michelson one, but if it’s used to measure optical surfaces with different reflectance, the whole optical unit has to be changed. Itshould have had the similar reflectance reference. But that will bring a lot of trou-ble and many more accessories are needed. This paper deals with the adjustmentfor the fringe contrast of a common-path interferometer by the double quarter wa-ve-plates. As two wave-plates are rotating simultaneously with an equal angle, thefringes of high contrast are obtained. This method is suitable not only for the mea-surement of high reflectance element, but also for the measurement of very lowreflectance elements.更多还原