【摘要】 本文报导了在集成运算放大器电路中观察到的两种动态漂移现象。分析表明,一种是由输出电压变化引起的电热反馈效应;另一种可以解释为由于共模输入电压引起离子迁移的结果。更多还原

【Abstract】 This paper describes dynamic drifts observed in integrated operational amplifiers. Experimentally it is found that there are two different mechanisms contributing to the dynamic drifts. One mechanism which is due to the thermal-electric feedback caused by output voltage swing is demonstrated and the other can be explained as ion drift caused by the common-mode input voltage.更多还原