节点文献
硅酸盐矿物的离子探针分析:二次离子质谱特征
Ion Microprobe Analysis of Silicate Minerals:Characteristics of the Secondary Ion Mass Spectrum
【摘要】 本文介绍用我国研制的LT-1型离子探针对四种不同SiO4四面体结构类型和不同成份特微的硅酸盐矿物石英、橄榄石辉石和云母作了二次离子质谱分析试验。在16O-轰击的条件下测得的正二次离子质谱表明:①主原子离子能反映主元素成分;②主元素原子与氧结成一系列有规律组合的二元、三元、四元……等多元离子;③这些多元离子的强度关系表现多样复杂性,其中尤以(Si2O)+>(SiO2)+及(Al2O)+>(AlO2)+为有趣,值得进一步工作;④这些氧化物多元离子并不与矿物原来的结构特微相连系。根据这些多元离子的出现规律可以基本估计主元素对痕元素的质量干扰。
【Abstract】 This paper reports the results concerning the characteristics ofSIMS spectra of silicate minerals quartz, olivine, pyroxene and mica analyzed byusing the domestically developed ion microprobe LT-1. Under the condition of 16O-bombardment the characteristics of the SIMS spectra obtained show: (1) the mainatomic ions practically reflect the main elemental constitutents; (2) the mainatoms combine with oxygen to form a series of multi-atomic ions which can beregularly arranged as dim, trim, tetram, pentam, …etc.; (3) among the varietiesand complexities of the intensity relationship of these multi-atomic ions, (Si2o)+>(Si2O2)+>(SiO2)+ and (Al2O)+>(Al2O2)+>(AlO2)+ are especially interestingabnomals worth further investigations; (4) no interrelationship between thesemulti-atomic ions and the original structural characteristics of the silicate minerals.In the light of the knowledge about the presence of these multi-atomic ions themass interference of main elements on trace elements can be practically predicted.
- 【文献出处】 仪器仪表学报 ,Chinese Journal of Scientific Instrument , 编辑部邮箱 ,1981年01期
- 【下载频次】48