【摘要】 对提拉法生长的YAG单晶首次用X射线透射形貌术观察。揭示了YAG单晶的生长条纹、奇异小面以及垂直于生长条纹的位错线束等生长缺陷,并对这些缺陷作了简要的分析。更多还原

【Abstract】 It was the first time to investigate defects in YAG single crystal grown by Czochralski method by means of X-ray transmission topography. Several grown-in defects, such as growth striations, singular facets and dislocation bands perpendicular to the grown striation, were revealed. The configuration and formation of these defects were discussed in brief.更多还原