【摘要】 本文描述了用4πx（LS）-γ符合技术测定⁶⁷Ga衰变率的精确方法[不确定度±0.05％（3σ）]。通过把X道的计数率外推到100％的效率和无限长的死时间,同时确定了子体⁶⁷Zn亚稳态的半衰期和内转换跃迁强度。更多还原

【Abstract】 In this paper an accurate method [with an uncertainty of ±0.5%(3σ)] for determination of the disintegration rate of 67Ga by 4πx(LS) - y coincidence is described. The half life and internal conversion transition intensity of 67Zn (daughter of 67Ga) were determinated simultaneously by extrapolating counting rate of the X channel to 100% efficiency and infinite dead time.更多还原