【摘要】 本文介绍了两种简易的法向热发射率测定装置. 第一种是E·Schmidt氏装置的简化与改进,它是基于测定待测物体表面的本身热辐射;第二种是基于测定待测表面对一个热辐射源辐射的反射率而间接地确定热发射率.对这两种装置的工作原理分别作出了近似的理论分析,列出了实验数据.经使用表明,这两种装置操作方便,性能稳定,可用于表面热发射率的检测.更多还原

【Abstract】 Two simple apparatuses for measuring the normal thermal emissivity of the metaIs and coatings are described in this paper. The first is a simplified and improved one based on the apparatus designed by E. Schmidt, the principle of which consists in measuring the radiation emission of the surface to be determined. The second one is to measure the reflectivity of the surface for incident thermal radiation from a source, thus the emissivity can be determined indirectly. Approximate theoretical analyses are carried out for these two apparatuses and experimental date are presented.Experiments have shown that the apparatuses described here are easily manageable, their performances are reliable and they arc applicable to the determination and cheeking of the emissivity of the surfaces.更多还原